Dainippon Screen Mfg. announced that they had established a new technology that analyzed the film property of the thin film silicon solar panel

【 Kyoto ]Dainippon Screen Mfg. announced that they had established a new technology that analyzed the film property of the thin film silicon solar panel in cooperation with University of Gifu on the 21st.
It is useful for the prevention of the photofatigue to which conversion efficiency decreases by analyzing the amount of the hydrogen incorporated when the amorphous silicon film is generated on the glass basal plate.
It installs in the film thickness measurement provision of this company as a measuring machine ability of the film quality analysis, and it aims at the practical use this autumn.
There were difficulties in stabilization and the rationalization of production of the cell performance because up to now, there was no technology that analyzed the hydrogen content of the thin-film solar cell accurately though excessive hydrogen caused the photofatigue.
The conversion efficiency of the thin-film solar cell panel leads to the difficulty overcoming if the element cell can specify it by the inspection because the efficiency depends on the low element cell.
It chiefly succeeded in the accurate assessment of the amount of the photoabsorption and the photorefraction degree of the amorphous silicon film by the method that was called "Spectroscopic ellipsometry" used with the semiconductor, and the analyses even of the structure of the hydrogen content etc.

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